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THE STUDY OF NANOMETER--DEFORMATION WITH THE SCANNING TUNNELING MICROSCOPE[J]. Chinese Journal of Theoretical and Applied Mechanics, 1997, 29(3): 332-335. doi: 10.6052/0459-1879-1997-3-1995-233
Citation: THE STUDY OF NANOMETER--DEFORMATION WITH THE SCANNING TUNNELING MICROSCOPE[J]. Chinese Journal of Theoretical and Applied Mechanics, 1997, 29(3): 332-335. doi: 10.6052/0459-1879-1997-3-1995-233

THE STUDY OF NANOMETER--DEFORMATION WITH THE SCANNING TUNNELING MICROSCOPE

doi: 10.6052/0459-1879-1997-3-1995-233
  • Publish Date: 1997-05-25
  • By using the scanning tunneling microscope, a new method was put forw ard for measuring the nanometer-deformation with the atom structure. This measuring principle was used to measure the residual deformations of the irradiated single crystal graphite (HOPG) and the Si(111)7×7 surface after atom manipulation. The experimental results verify the present nanometer grid method for measuring nonometer-deformation.

     

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      沈阳化工大学材料科学与工程学院 沈阳 110142

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