THE STUDY OF NANOMETER--DEFORMATION WITH THE SCANNING TUNNELING MICROSCOPE

doi:10.6052/0459-1879-1997-3-1995-233

Article Contents

Article Navigation > Chinese Journal of Theoretical and Applied Mechanics > 1997 > 29(3): 332-335

THE STUDY OF NANOMETER--DEFORMATION WITH THE SCANNING TUNNELING MICROSCOPE[J]. Chinese Journal of Theoretical and Applied Mechanics, 1997, 29(3): 332-335. doi: 10.6052/0459-1879-1997-3-1995-233

Citation:

THE STUDY OF NANOMETER--DEFORMATION WITH THE SCANNING TUNNELING MICROSCOPE[J]. Chinese Journal of Theoretical and Applied Mechanics, 1997, 29(3): 332-335. doi: 10.6052/0459-1879-1997-3-1995-233

THE STUDY OF NANOMETER--DEFORMATION WITH THE SCANNING TUNNELING MICROSCOPE[J]. Chinese Journal of Theoretical and Applied Mechanics, 1997, 29(3): 332-335. doi: 10.6052/0459-1879-1997-3-1995-233

Citation:

THE STUDY OF NANOMETER--DEFORMATION WITH THE SCANNING TUNNELING MICROSCOPE[J]. Chinese Journal of Theoretical and Applied Mechanics, 1997, 29(3): 332-335. doi: 10.6052/0459-1879-1997-3-1995-233

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THE STUDY OF NANOMETER--DEFORMATION WITH THE SCANNING TUNNELING MICROSCOPE

doi: 10.6052/0459-1879-1997-3-1995-233

清华大学工程力学系,100084

Publish Date: 1997-05-25

Abstract

Abstract

By using the scanning tunneling microscope, a new method was put forw ard for measuring the nanometer-deformation with the atom structure. This measuring principle was used to measure the residual deformations of the irradiated single crystal graphite (HOPG) and the Si(111)7×7 surface after atom manipulation. The experimental results verify the present nanometer grid method for measuring nonometer-deformation.
- scanning tunneling microscope,
- grid method,
- nanometer-deformation