THE STUDY OF NANOMETER--DEFORMATION WITH THE SCANNING TUNNELING MICROSCOPE

By using the scanning tunneling microscope, a new method was put forw ard for measuring the nanometer-deformation with the atom structure. This measuring principle was used to measure the residual deformations of the irradiated single crystal graphite (HOPG) and the Si(111)7×7 surface after atom manipulation. The experimental results verify the present nanometer grid method for measuring nonometer-deformation.