Abstract: Digital volume correlation (DVC) is a powerful experimental tool for quantitative 3D internal deformation measurement throughout the interior of materials or biological tissues. By comparing the volumetric images acquired at the reference and deformed states by a volumetric imaging facility (e.g., X-ray CT), DVC provides full-field displacements with subvoxel accuracy and full-field strain maps. When using DVC method for internal deformation measurement, the quality of internal speckle pattern of a test sample has an important impact on the accuracy and precision of the measured displacements. In this work, theoretical analysis and numerical simulation experiments are firstly performed to assess the quality of internal speckle patterns. The results show that the displacement measurement error of DVC is negative correlation with the sum of square of subvolume intensity gradient (SSSIG) of a subvolume. Thus, the SSSIG value of a subvolume can be used as a simple and effective metric for quality assessment of its internal speckle pattern. In practical DVC analyses, increasing the SSSIG parameter of a subvolume helps to improve the measurement accuracy and precision of DVC. Despite the SSSIG in a subvolume can be increased by enlarging its subvolume size, this simple approach, however, would lead to increased calculation burden. With a purpose to increase SSSIG without significantly increase the amount of calculation, this paper further proposes a method for optimal selection of calculation voxel points in subvolumes. Specifically, the voxel points with small gray gradients in a subvolume are excluded from DVC calculation to decrease the amount of calculation when increasing the size of the subvolume. The efficacy of the presented voxel point optimal selection method is validated by analyzing computer simulated and experimentally obtained volume images. Experimental results reveal that the proposed voxel point selection method is capable of reducing the calculation burden when increasing the subvolume size to increase the SSSIG parameters.